Abstract

Ho Soonmin

DOI : http://dx.doi.org/10.13005/ojc/330466

In this work, X-ray diffraction technique was applied to determine the structure of nickel lead sulphide thin films prepared by chemical bath deposition. The X-ray diffraction patterns reflect that polycrystalline Ni₃Pb₂S₂ could be obtained using the method explained. The XRD data show that an increasing the deposition time from 7 to 30 hours resulted in increase in the number of peaks.

Thin films; solar cell; chemical bath deposition; x-ray diffraction

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