Abstract

K. Venkata Ramana^1,2*, M. Chandra Shekar² and V. Madhusudhana Reddy³

DOI : http://dx.doi.org/10.13005/ojc/380412

Solution Casting Technique (SCT) is used to prepare the films of poly vinylidene difluoride (PVDF) + poly ethylene glycol (PEG) + nano silicon dioxide (SiO2.). Modifications in structure, thermal stability and energy band gap values of all prepared thin films have been studied using XRD, SEM, DSC and UV-Vis. The disappearance of a small dip at higher concentrations of DSC plots of nano SiO2 in PVDF+PEG indicates that the decrease in the crystallinity which also supported by XRD results. From the SEM results it is observed that, at 10 wt.% of nano SiO2 of concentration amorphous nature is more which leads increase in thermal stability of the material. FTIR results show strong growth in the CF2 stretching with increasing concentratration of nano SiO2 in PVDF+PEG and also the intensity of the aliphatic C-H scattering vibrational bands are observed in spectra of PVDF+PEG and PVDF+PEG+nano SiO2. The direct band gap values of PVDF+PEG+nano SiO2 polymer electrolyte indicates the influence of nano SiO2 on PVDF+PEG for better conducting properties.

Fourier Transform Infra-Red Spectrometer; Poly Vinylidene Difluoride; Poly Ethylene Glycol; Silicon Dioxide

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